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VLSID
2006
IEEE
150views VLSI» more  VLSID 2006»
14 years 5 months ago
A Comprehensive SoC Design Methodology for Nanometer Design Challenges
SoC design methodologies are under constant revision due to adoption of fast shrinking process technologies at nanometer levels. Nanometer process geometries exhibit new complex d...
R. Raghavendra Kumar, Ricky Bedi, Ramadas Rajagopa...
VLSID
2006
IEEE
183views VLSI» more  VLSID 2006»
13 years 11 months ago
Design Challenges for High Performance Nano-Technology
This tutorial present the key aspects of design challenges and its solutions that are being experienced in VLSI design in the era of nano technology. The focus will be on design c...
Goutam Debnath, Paul J. Thadikaran
NOCS
2010
IEEE
13 years 2 months ago
Addressing Manufacturing Challenges with Cost-Efficient Fault Tolerant Routing
Abstract--The high-performance computing domain is enriching with the inclusion of Networks-on-chip (NoCs) as a key component of many-core (CMPs or MPSoCs) architectures. NoCs face...
Samuel Rodrigo, Jose Flich, Antoni Roca, Simone Me...
DAC
2000
ACM
14 years 5 months ago
Test challenges for deep sub-micron technologies
The use of deep submicron process technologies presents several new challenges in the area of manufacturing test. While a significant body of work has been devoted to identifying ...
Kwang-Ting Cheng, Sujit Dey, Mike Rodgers, Kaushik...