98 search results - page 3 / 20 » Design Optimization for Robustness to Single Event Upsets |
IOLTS
2005
IEEE
13 years 11 months ago
2005
IEEE
As device geometries continue to shrink, single event upsets are becoming of concern to a wider spectrum of system designers. These “soft errors” can be a nuisance or catastro...
DATE
2005
IEEE
13 years 11 months ago
2005
IEEE
Triple Modular Redundancy (TMR) is a suitable fault tolerant technique for SRAM-based FPGA. However, one of the main challenges in achieving 100% robustness in designs protected b...
ICCD
2008
IEEE
14 years 2 months ago
2008
IEEE
- This paper performs analysis and design of latches and flip-flops while considering the effect of event upsets caused by energetic particle hits. First it is shown that the conve...
DDECS
2007
IEEE
13 years 11 months ago
2007
IEEE
Logic Soft Errors caused by radiation are a major concern when working with circuits that need to operate in harsh environments, such as space or avionics applications, where soft ...
DATE
2009
IEEE
14 years 1 days ago
2009
IEEE
—Flash-based FPGAs are increasingly demanded in safety critical fields, in particular space and avionic ones, due to their non-volatile configuration memory. Although they are al...