135 search results - page 3 / 27 » Design challenges at 65nm and beyond |
DAC
2009
ACM
14 years 6 months ago
2009
ACM
With aggressive technology scaling, SRAM design has been seriously challenged by the difficulties in analyzing rare failure events. In this paper we propose to create statistical ...
ISQED
2008
IEEE
14 years 5 days ago
2008
IEEE
Large-scale process fluctuations (particularly random device mismatches) at nanoscale technologies bring about highdimensional strongly nonlinear performance variations that canno...
DAC
2006
ACM
14 years 6 months ago
2006
ACM
As VLSI technology scales toward 65nm and beyond, both timing and power performance of integrated circuits are increasingly affected by process variations. In practice, people oft...
ISLPED
2010
ACM
13 years 6 months ago
2010
ACM
Thermal energy harvesting using micro-scale thermoelectric generators is a promising approach to alleviate the power supply challenge in ultra low power systems. In thermal energy...
ISPD
2009
ACM
14 years 18 days ago
2009
ACM
As VLSI technology moves to the 65nm node and beyond, interconnect delay greatly limits the circuit performance. As a critical component in interconnect synthesis, layer assignmen...