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DATE
2007
IEEE
155views Hardware» more  DATE 2007»
13 years 10 months ago
Design fault directed test generation for microprocessor validation
Functional validation of modern microprocessors is an important and complex problem. One of the problems in functional validation is the generation of test cases that has higher p...
Deepak Mathaikutty, Sandeep K. Shukla, Sreekumar V...
ITC
1998
IEEE
95views Hardware» more  ITC 1998»
13 years 8 months ago
Native mode functional test generation for processors with applications to self test and design validation
New methodologies based on functional testing and built-in self-test can narrow the gap between necessary solutions and existing techniques for processor validation and testing. W...
Jian Shen, Jacob A. Abraham
DATE
2005
IEEE
115views Hardware» more  DATE 2005»
13 years 10 months ago
Functional Coverage Driven Test Generation for Validation of Pipelined Processors
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...
Prabhat Mishra, Nikil D. Dutt
CODES
2008
IEEE
13 years 6 months ago
Specification-based compaction of directed tests for functional validation of pipelined processors
Functional validation is a major bottleneck in microprocessor design methodology. Simulation is the widely used method for functional validation using billions of random and biase...
Heon-Mo Koo, Prabhat Mishra
MTV
2006
IEEE
98views Hardware» more  MTV 2006»
13 years 10 months ago
Directed Micro-architectural Test Generation for an Industrial Processor: A Case Study
Simulation-based validation of the current industrial processors typically use huge number of test programs generated at instruction set architecture (ISA) level. However, archite...
Heon-Mo Koo, Prabhat Mishra, Jayanta Bhadra, Magdy...