122 search results - page 2 / 25 » Designing a Memory Module Tester |
ISCAS
2006
IEEE
13 years 11 months ago
2006
IEEE
This paper presents a multilevel (ML) Flash memory onchip error correction system design based on the concept of trellis coded modulation (TCM). This is motivated by the non-trivi...
CASES
2007
ACM
13 years 9 months ago
2007
ACM
The memory intensive nature of object-oriented languages such as C++ and Java has created the need of a high-performance dynamic memory management (DMM); however, it is a challeng...
ITC
2000
IEEE
13 years 10 months ago
2000
IEEE
A common approachfor large industrial designs is to use logic built-in self-test (LBIST)followed by test data from an external tester. Because the fault coverage with LBIST alone ...
ICC
2007
IEEE
14 years 2 days ago
2007
IEEE
— Given an AWGN channel, we look at the problem of designing a source controlled binary antipodal signaling system for transmitting blocks of binary symbols generated either by a...
HOTOS
2003
IEEE
13 years 11 months ago
2003
IEEE
Two big problems with operating systems written in unsafe languages are that they crash too often and that adding features becomes much more difficult over time. One cause of bot...