4 search results - page 1 / 1 » Detection of Resistive Shorts in Deep Sub-micron Technologie... |
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
Current-based tests are the most effective methods available to detect resistive shorts. Delta IDDQ testing is the most sensitive variant and can handle off-state currents of 10-1...
DATE
2010
IEEE
13 years 9 months ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
VTS
2008
IEEE
13 years 11 months ago
2008
IEEE
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
ISCA
2010
IEEE
13 years 8 months ago
2010
IEEE
As leakage and other charge storage limitations begin to impair the scalability of DRAM, non-volatile resistive memories are being developed as a potential replacement. Unfortunat...