16 search results - page 1 / 4 » Deterministic test generation for non-classical faults on th... |
ATS
1995
IEEE
13 years 9 months ago
1995
IEEE
ET
2010
13 years 2 months ago
2010
This work justifies several quantum gate level fault models and discusses the causal error mechanisms thwarting correct function. A quantum adaptation of the classical test set gen...
ITC
1993
IEEE
13 years 9 months ago
1993
IEEE
This paper presents an efficient approach to generate tests for gate delay faults. Unlike other known algorithms which try to generate a 'good' delay test the presented ...
DATE
1998
IEEE
13 years 9 months ago
1998
IEEE
A new approach for sequential circuit test generation is proposed that combines software testing based techniques at the high level with test enhancement techniques at the gate le...
ISMVL
2005
IEEE
13 years 11 months ago
2005
IEEE
It is believed that quantum computing will begin to have a practical impact in industry around year 2010. We propose an approach to test generation and fault localization for a wi...