6 search results - page 1 / 2 » Device and architecture concurrent optimization for FPGA tra... |
ICCAD
2007
IEEE
14 years 1 months ago
2007
IEEE
Late CMOS scaling reduces device reliability, and existing work has studied the permanent SER (soft error rate) for configuration memory in FPGA extensively. In this paper, we sh...
ICPP
2008
IEEE
13 years 11 months ago
2008
IEEE
The issue queue (IQ) is a key microarchitecture structure for exploiting instruction-level and thread-level parallelism in dynamically scheduled simultaneous multithreaded (SMT) p...
ASAP
2008
IEEE
13 years 11 months ago
2008
IEEE
As semiconductor processing technology continues to scale down, managing reliability becomes an increasingly difficult challenge in high-performance microprocessor design. Transie...
HPCA
2006
IEEE
14 years 5 months ago
2006
IEEE
With reducing feature size, increasing chip capacity, and increasing clock speed, microprocessors are becoming increasingly susceptible to transient (soft) errors. Redundant multi...
HPCA
2008
IEEE
13 years 11 months ago
2008
IEEE
With reducing feature size, increasing chip capacity, and increasing clock speed, microprocessors are becoming increasingly susceptible to transient (soft) errors. Redundant multi...