In this paper we explore two alternative approaches to system diagnosis. The first strategy is based on testability analysis performed by SATAN tool. The second approach performed ...
Continued technology scaling is resulting in systems with billions of devices. Unfortunately, these devices are prone to failures from various sources, resulting in even commodity...
—In the past, software based scan chain defect diagnosis can be roughly classified into two categories (1) model-based algorithms, and (2) data-driven algorithms. In this paper w...
Extreme technology scaling in silicon devices drastically affects reliability, particularly because of runtime failures induced by transistor wearout. Currently available online t...
Creating accurate models of information systems is an important but challenging task. It is generally well understood that such modeling encompasses general scientific issues, bu...
Ulrik Franke, Pontus Johnson, Robert Lagerströ...