19 search results - page 1 / 4 » Diagnosis of Realistic Defects Based on the X-Fault Model |
DDECS
2008
IEEE
13 years 6 months ago
2008
IEEE
Defects not described by conventional fault models are a challenge for state-of-the-art fault diagnosis techniques. The X-fault model has been introduced recently as a modeling te...
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
Abstract — This paper defines a new diagnosis problem for diagnosing delay defects based upon statistical timing models. We illustrate the differences between the delay defect d...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
— In this paper, we study the problem of delay defect diagnosis based on statistical timing models. We propose a diagnosis algorithm that can effectively utilize statistical timi...
ITC
1998
IEEE
13 years 9 months ago
1998
IEEE
Automated fault diagnosis based on the stuckat fault model is not always effective. This paper presents practical experiences in applying a bridging fault based diagnosis techniqu...
ASPDAC
2001
ACM
13 years 8 months ago
2001
ACM
Loical defect diagnosis is a critical yet challenging process in VLSI manufacturing. It involves the identification of the defect spots in a logic IC that fails testing. In the la...