19 search results - page 4 / 4 » Diagnosis of Realistic Defects Based on the X-Fault Model |
ASPDAC
2009
ACM
13 years 12 months ago
2009
ACM
Low power circuits have become a necessary part in modern designs. Retention flip-flop is one of the most important components in low power designs. Conventional test methodologie...
FIMH
2009
Springer
13 years 12 months ago
2009
Springer
Computational models of myocardial perfusion in normal as well as pathological conditions have contributed to recent advances in the personalized diagnosis and treatment of cardiov...
HPCA
2006
IEEE
14 years 5 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
JNSM
2008
13 years 5 months ago
2008
There is a large conceptual gap between end-to-end infrastructure requirements and detailed component configuration implementing those requirements. Today, this gap is manually br...