6 search results - page 1 / 2 » Diagnosis of clustered faults and wafer testing |
TCAD
1998
13 years 4 months ago
1998
—A probabilistic diagnosis algorithm is presented for constant degree structures. The performance of the algorithm is analyzed under a negative binomial failure distribution to a...
GLVLSI
2005
IEEE
13 years 10 months ago
2005
IEEE
We develop a novel on-line built-in self-test (BIST) technique for testing FPGAs that has a very high diagnosability even in presence of clustered faults, a fault pattern for whic...
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
— Fault diagnosis has particular importance in the context of field programmable gate arrays (FPGAs) because faults can be avoided by reconfiguration at almost no real cost. Cl...
TCAD
2002
13 years 4 months ago
2002
As IC densities are increasing, cluster-based FPGA architectures are becoming the architecture of choice for major FPGA manufacturers. A cluster-based architecture is one in which...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
Keeping diagnostic resolution as high as possible while maximizing the compaction ratio is subject to research since the advent of embedded test. In this paper, we present a novel...