—A probabilistic diagnosis algorithm is presented for constant degree structures. The performance of the algorithm is analyzed under a negative binomial failure distribution to a...
Kaiyuan Huang, Vinod K. Agarwal, Krishnaiyan Thula...
We develop a novel on-line built-in self-test (BIST) technique for testing FPGAs that has a very high diagnosability even in presence of clustered faults, a fault pattern for whic...
— Fault diagnosis has particular importance in the context of field programmable gate arrays (FPGAs) because faults can be avoided by reconfiguration at almost no real cost. Cl...
As IC densities are increasing, cluster-based FPGA architectures are becoming the architecture of choice for major FPGA manufacturers. A cluster-based architecture is one in which...
Keeping diagnostic resolution as high as possible while maximizing the compaction ratio is subject to research since the advent of embedded test. In this paper, we present a novel...