3 search results - page 1 / 1 » Diagnosis of defects on scan enable and clock trees |
DATE
2006
IEEE
13 years 10 months ago
2006
IEEE
ATS
2009
IEEE
13 years 11 months ago
2009
IEEE
Diagnosis is increasingly important, not only for individual analysis of failing ICs, but also for high-volume test response analysis which enables yield and test improvement. Sca...
TCAD
2011
12 years 11 months ago
2011
—Pre-bond testing of 3-D stacked integrated circuits (ICs) involves testing each individual die before bonding. The overall yield of 3-D ICs improves with pre-bond testability be...