3 search results - page 1 / 1 » Diagnosis of defects on scan enable and clock trees |
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
ATS
2009
IEEE
14 years 5 days ago
2009
IEEE
Diagnosis is increasingly important, not only for individual analysis of failing ICs, but also for high-volume test response analysis which enables yield and test improvement. Sca...
TCAD
2011
13 years 9 days ago
2011
—Pre-bond testing of 3-D stacked integrated circuits (ICs) involves testing each individual die before bonding. The overall yield of 3-D ICs improves with pre-bond testability be...