22 search results - page 3 / 5 » Digital Technologies and Marginalized Youth |
ISQED
2005
IEEE
13 years 11 months ago
2005
IEEE
As technology continues to scale beyond 100nm, there is a significant increase in performance uncertainty of CMOS logic due to process and environmental variations. Traditional c...
ECCTD
2011
12 years 5 months ago
2011
⎯ Technology scaling is in the era where the chip performance is constrained by its power dissipation. Although the power limits vary with the application domain, they dictate th...
PERVASIVE
2009
Springer
14 years 3 days ago
2009
Springer
Abstract. We show that accelerometers embedded in a television remote control can be used to distinguish household members based on the unique way each person wields the remote. Th...
ISQED
2006
IEEE
13 years 11 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) has the potential to become one of the main show-stoppers of circuit reliability in nanometer scale devices due to its deleterious ...
DAC
2007
ACM
14 years 6 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...