159 search results - page 1 / 32 » Digital statistical analysis using VHDL |
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
EURODAC
1994
IEEE
13 years 9 months ago
1994
IEEE
This paper presents a testability improvement method for digital systems described in VHDL behavioral specification. The method is based on testability analysis at registertransfe...
EURODAC
1994
IEEE
13 years 9 months ago
1994
IEEE
- The accelerator is destined to circuit-level simulation of digital and analog/digital MOS VLSI'c containing of up to 100 thousand transistors (with 16 Mb RAM host-machine). ...
DPHOTO
2009
13 years 2 months ago
2009
The lifetime of solid-state image sensors is limited by the appearance of defects, particularly hot-pixels, which we have previously shown to develop continuously over the sensor ...
EMSOFT
2006
Springer
13 years 8 months ago
2006
Springer
Upper bounds on worst-case execution times, which are commonly called WCET, are a prerequisite for validating the temporal correctness of tasks in a real-time system. Due to the e...