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» Doubled Patterns are 3-Avoidable
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ICDAR
2009
IEEE
13 years 3 months ago
A Unified Framework Based on the Level Set Approach for Segmentation of Unconstrained Double-Sided Document Images Suffering fro
A novel method for the segmentation of double-sided ancient document images suffering from bleed-through effect is presented. It takes advantage of the level set framework to prov...
Reza Farrahi Moghaddam, David Rivest-Hénaul...
ICDAR
2009
IEEE
13 years 3 months ago
Registration and Enhancement of Double-Sided Degraded Manuscripts Acquired in Multispectral Modality
We propose a system to process multispectral scans of double-sided documents. It can co-register any number of recto and verso channel maps, and reduce the bleed-through/show-thro...
Anna Tonazzini, Gianfranco Bianco, Emanuele Salern...
PR
2000
66views more  PR 2000»
13 years 5 months ago
Projective Fourier analysis for patterns
: Identifying PSL(2, C) as a projective group for patterns in the conformal camera model, the projective harmonic analysis on its double covering group SL(2, C) is presented in the...
Jacek Turski
SLIP
2009
ACM
14 years 8 days ago
Is overlay error more important than interconnect variations in double patterning?
Double patterning lithography seems to be a prominent choice for 32nm and 22nm technologies. Double patterning lithography techniques require additional masks for a single interco...
Kwangok Jeong, Andrew B. Kahng, Rasit Onur Topalog...
ISQED
2010
IEEE
141views Hardware» more  ISQED 2010»
14 years 19 days ago
Assessing chip-level impact of double patterning lithography
—Double patterning lithography (DPL) provides an attractive alternative or a supplementary method to enable the 32nm and 22nm process nodes, relative to costlier technology optio...
Kwangok Jeong, Andrew B. Kahng, Rasit Onur Topalog...