Sciweavers

117 search results - page 1 / 24
» Efficient Analog Test Methodology Based on Adaptive Algorith...
Sort
View
DAC
1998
ACM
13 years 9 months ago
Efficient Analog Test Methodology Based on Adaptive Algorithms
This papers describes a new, fast and economical methodology to test linear analog circuits based on adaptive algorithms. To the authors knowledge, this is the first time such tec...
Luigi Carro, Marcelo Negreiros
TOOLS
2000
IEEE
13 years 9 months ago
Testing-for-Trust: The Genetic Selection Model Applied to Component Qualification
This paper presents a method and a tool for building trustable OO components. The methodology is based on an integrated design and test approach for OO software components. It is ...
Benoit Baudry, Vu Le Hanh, Yves Le Traon
DATE
1997
IEEE
114views Hardware» more  DATE 1997»
13 years 9 months ago
Compact structural test generation for analog macros
A structural, fault-model based methodology for the generation of compact high-quality test sets for analog macros is presented. Results are shown for an IVconverter macro design....
V. Kaal, Hans G. Kerkhoff
ATS
2004
IEEE
109views Hardware» more  ATS 2004»
13 years 8 months ago
Reconfiguration for Enhanced ALternate Test (REALTest) of Analog Circuits
An efficient design for test methodology to increase the test yield of analog circuits is presented. It is assumed that the analog circuits are tested using alternate tests that r...
Ganesh Srinivasan, Shalabh Goyal, Abhijit Chatterj...
CAL
2004
13 years 4 months ago
An Efficient Fault-Tolerant Routing Methodology for Meshes and Tori
In this paper we present a methodology to design fault-tolerant routing algorithms for regular direct interconnection networks. It supports fully adaptive routing, does not degrade...
María Engracia Gómez, José Du...