Dynamic error processing approaches are an important mechanism to increase the reliability in a multiprocessor system, while making efficient use of the available resources. To th...
Andrea Bondavalli, Silvano Chiaradonna, Felicita D...
The importance of transient faults is predicted to grow due to current technology trends of increased scale of integration. One of the components that will be significantly affecte...
It is widely accepted that transient failures will appear more frequently in chips designed in the near future due to several factors such as the increased integration scale. On t...
It is widely accepted that transient failures will appear more frequently in chips designed in the near future due to several factors such as the increased integration scale. On th...
Continuously shrinking feature sizes result in an increasing susceptibility of circuits to transient faults, e.g. due to environmental radiation. Approaches to implement fault tol...