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ASAP
2005
IEEE
13 years 11 months ago
2005
IEEE
In this paper we introduce a design methodology that allows the system/circuit designer to build reliable systems out of unreliable nano-scale components. The central point of our...
DAC
2010
ACM
13 years 8 months ago
2010
ACM
Effective system verification requires good specifications. The lack of sufficient specifications can lead to misses of critical bugs, design re-spins, and time-to-market slips. I...
OSDI
1996
ACM
13 years 6 months ago
1996
ACM
This paper describes a novel approach to providingmodular and extensible operating system functionality and encapsulated environments based on a synthesis of microkernel and virtu...
DAC
2007
ACM
14 years 6 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
DATE
1999
IEEE
13 years 9 months ago
1999
IEEE
Dynamically reconfigurable embedded systems offer potential for higher performance as well as adaptability to changing system requirements at low cost. Such systems employ run-tim...