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VLSID
2009
IEEE
115views VLSI» more  VLSID 2009»
14 years 5 months ago
Efficient Techniques for Directed Test Generation Using Incremental Satisfiability
Functional validation is a major bottleneck in the current SOC design methodology. While specification-based validation techniques have proposed several promising ideas, the time ...
Prabhat Mishra, Mingsong Chen
TCAD
2010
102views more  TCAD 2010»
12 years 11 months ago
Functional Test Generation Using Efficient Property Clustering and Learning Techniques
Abstract--Functional verification is one of the major bottlenecks in system-on-chip design due to the combined effects of increasing complexity and lack of automated techniques for...
Mingsong Chen, Prabhat Mishra
VLSID
2010
IEEE
155views VLSI» more  VLSID 2010»
13 years 2 months ago
Synchronized Generation of Directed Tests Using Satisfiability Solving
Directed test generation is important for the functional verification of complex system-on-chip designs. SAT based bounded model checking is promising for counterexample generatio...
Xiaoke Qin, Mingsong Chen, Prabhat Mishra
DAC
1998
ACM
14 years 5 months ago
Functional Vector Generation for HDL Models Using Linear Programming and 3-Satisfiability
Abstract-Our strategy for automatic generation of functional vectors is based on exercising selected paths in the given hardware description language (HDL) model. The HDL model des...
Farzan Fallah, Srinivas Devadas, Kurt Keutzer
SIGSOFT
2010
ACM
13 years 2 months ago
Directed test suite augmentation: techniques and tradeoffs
Test suite augmentation techniques are used in regression testing to identify code elements affected by changes and to generate test cases to cover those elements. Our preliminary...
Zhihong Xu, Yunho Kim, Moonzoo Kim, Gregg Rotherme...