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ICST
2008
IEEE
13 years 11 months ago
Efficient Test Data Generation for Variables with Complex Dependencies
This paper introduces a new method for generating test data that combines the benefits of equivalence partitioning, boundary value analysis and cause-effect analysis. It is suitab...
Armin Beer, Stefan Mohacsi
DATE
2010
IEEE
149views Hardware» more  DATE 2010»
13 years 9 months ago
Efficient decision ordering techniques for SAT-based test generation
Model checking techniques are promising for automated generation of directed tests. However, due to the prohibitively large time and resource requirements, conventional model chec...
Mingsong Chen, Xiaoke Qin, Prabhat Mishra
ICST
2010
IEEE
13 years 2 months ago
Automated Test Data Generation on the Analyses of Feature Models: A Metamorphic Testing Approach
A Feature Model (FM) is a compact representation of all the products of a software product line. The automated extraction of information from FMs is a thriving research topic invo...
Sergio Segura, Robert M. Hierons, David Benavides,...
VLSID
2005
IEEE
131views VLSI» more  VLSID 2005»
14 years 5 months ago
Efficient Space/Time Compression to Reduce Test Data Volume and Testing Time for IP Cores
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
Lei Li, Krishnendu Chakrabarty, Seiji Kajihara, Sh...
BMCBI
2008
122views more  BMCBI 2008»
13 years 5 months ago
Effects of dependence in high-dimensional multiple testing problems
Background: We consider effects of dependence among variables of high-dimensional data in multiple hypothesis testing problems, in particular the False Discovery Rate (FDR) contro...
Kyung In Kim, Mark A. van de Wiel