This paper describes a Hybrid DFT (H-DFT) architecture for low-cost, high quality structural testing in the high volume manufacturing (HVM) environment. This structure efficiently...
David M. Wu, Mike Lin, Subhasish Mitra, Kee Sup Ki...
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
Lei Li, Krishnendu Chakrabarty, Seiji Kajihara, Sh...
Multi-pattern string matching remains a major performance bottleneck in network intrusion detection and anti-virus systems for high-speed deep packet inspection (DPI). Although Aho...
Weirong Jiang, Yi-Hua Edward Yang, Viktor K. Prasa...