130 search results - page 25 / 26 » Efficiently Verifiable Escape Analysis |
DAC
2007
ACM
14 years 6 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
KDD
2008
ACM
14 years 6 months ago
2008
ACM
In some applications such as filling in a customer information form on the web, some missing values may not be explicitly represented as such, but instead appear as potentially va...
BMCBI
2008
13 years 5 months ago
2008
Background: The regulation of gene expression is complex and occurs at many levels, including transcriptional and post-transcriptional, in metazoans. Transcriptional regulation is...
DAC
2005
ACM
14 years 6 months ago
2005
ACM
We obtain analytically, the energy optimal speed profile of a generic multi-speed device with a discrete set of speeds, to execute a given task within a given time. Current implem...
SIGMOD
2008
ACM
14 years 5 months ago
2008
ACM
In some applications such as filling in a customer information form on the web, some missing values may not be explicitly represented as such, but instead appear as potentially va...