127 search results - page 1 / 26 » Efficiently generating test vectors with state pruning |
ASPDAC
2005
ACM
13 years 10 months ago
2005
ACM
- This paper extends the depth first search (DFS) used in the previously proposed witness string method for generating efficient test vectors. A state pruning method is added that ...
ATS
2000
IEEE
13 years 9 months ago
2000
IEEE
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
KDD
1994
ACM
13 years 9 months ago
1994
ACM
Pre-Pruning and Post-Pruning are two standard methods of dealing with noise in concept learning. Pre-Pruning methods are very efficient, while Post-Pruning methods typically are m...
ICCAD
1998
IEEE
13 years 9 months ago
1998
IEEE
A method is presented for identifying primitive path-delay faults in non-scan sequential circuits and generating robust tests for all robustly testable primitive faults. It uses t...
TVLSI
2008
13 years 4 months ago
2008
We present a Mutation-based Validation Paradigm (MVP) technology that can handle complete high-level microprocessor implementations and is based on explicit design error modeling, ...