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DDECS
2007
IEEE
175views Hardware» more  DDECS 2007»
14 years 12 days ago
Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair
—An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. A commonly used repair strategy is to equip memories with sp...
Philipp Öhler, Sybille Hellebrand, Hans-Joach...
IWQOS
2011
Springer
12 years 9 months ago
Adaptive data-driven service integrity attestation for multi-tenant cloud systems
Abstract—Cloud systems provide a cost-effective service hosting infrastructure for application service providers (ASPs). However, cloud systems are often shared by multiple tenan...
Juan Du, Xiaohui Gu, Nidhi Shah
ASWSD
2006
Springer
13 years 9 months ago
TestML - A Test Exchange Language for Model-Based Testing of Embedded Software
Abstract. Test processes in the automotive industry are tool-intensive and affected by technologically heterogeneous test infrastructures. In the industrial practice a product has ...
Juergen Grossmann, Ines Fey, Alexander Krupp, Mirk...
SE
2007
13 years 7 months ago
An integration framework for heterogeneous automatic software tests
: Developing and maintaining large software systems can require the usage of a variety of different automatic test tools. The complexity of the tools leads to considerable overhead...
Holger Schackmann, Horst Lichter, Veit Hoffmann