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ETS
2006
IEEE
77views Hardware» more  ETS 2006»
13 years 11 months ago
Enhancing Delay Fault Coverage through Low Power Segmented Scan
Zhuo Zhang, Sudhakar M. Reddy, Irith Pomeranz, Jan...
DFT
2004
IEEE
93views VLSI» more  DFT 2004»
13 years 8 months ago
First Level Hold: A Novel Low-Overhead Delay Fault Testing Technique
This paper presents a novel delay fault testing technique, which can be used as an alternative to the enhanced scan based delay fault testing, with significantly less design overh...
Swarup Bhunia, Hamid Mahmoodi-Meimand, Arijit Rayc...
ITC
1997
IEEE
73views Hardware» more  ITC 1997»
13 years 9 months ago
A Low-Overhead Design for Testability and Test Generation Technique for Core-Based Systems
In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has s...
Indradeep Ghosh, Niraj K. Jha, Sujit Dey
TASLP
2010
167views more  TASLP 2010»
12 years 11 months ago
Broadband Source Localization From an Eigenanalysis Perspective
Abstract--Broadband source localization has several applications ranging from automatic video camera steering to target signal tracking and enhancement through beamforming. Consequ...
Mehrez Souden, Jacob Benesty, Sofiène Affes