The discovery of subsets with special properties from binary data has been one of the key themes in pattern discovery. Pattern classes such as frequent itemsets stress the co-occu...
Eino Hinkkanen, Hannes Heikinheimo, Heikki Mannila...
Abstract--In double patterning lithography (DPL) layout decomposition for 45nm and below process nodes, two features must be assigned opposite colors (corresponding to different ex...
Andrew B. Kahng, Chul-Hong Park, Xu Xu, Hailong Ya...