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KDD
2007
ACM
165views Data Mining» more  KDD 2007»
14 years 5 months ago
Finding low-entropy sets and trees from binary data
The discovery of subsets with special properties from binary data has been one of the key themes in pattern discovery. Pattern classes such as frequent itemsets stress the co-occu...
Eino Hinkkanen, Hannes Heikinheimo, Heikki Mannila...
TCAD
2010
194views more  TCAD 2010»
13 years 6 days ago
Layout Decomposition Approaches for Double Patterning Lithography
Abstract--In double patterning lithography (DPL) layout decomposition for 45nm and below process nodes, two features must be assigned opposite colors (corresponding to different ex...
Andrew B. Kahng, Chul-Hong Park, Xu Xu, Hailong Ya...