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ISLPED
2009
ACM

154views Hardware» more ISLPED 2009»

Experimental analysis of sequence dependence on energy saving for error tolerant image processing

13 years 9 months ago

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We present experimental analysis to exploit the sequence dependence on energy saving in error tolerant image processing. Our analysis shows that the error distributions depend not...

Se Hun Kim, Saibal Mukhopadhyay, Wayne Wolf

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ASPDAC
2007
ACM

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A Software Technique to Improve Yield of Processor Chips in Presence of Ultra-Leaky SRAM Cells Caused by Process Variation

13 years 6 months ago

Download www.cecs.uci.edu

- Exceptionally leaky transistors are increasingly more frequent in nano-scale technologies due to lower threshold voltage and its increased variation. Such leaky transistors may e...

Maziar Goudarzi, Tohru Ishihara, Hiroto Yasuura

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