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ICCAD
2006
IEEE
126views Hardware» more  ICCAD 2006»
9 years 11 months ago
Exploring linear structures of critical path delay faults to reduce test efforts
It has been shown that the delay of a target path can be composed linearly of other path delays. If the later paths are robustly testable (with known delay values), the target pat...
Shun-Yen Lu, Pei-Ying Hsieh, Jing-Jia Liou
VTS
2000
IEEE
94views Hardware» more  VTS 2000»
9 years 7 months ago
On Testing the Path Delay Faults of a Microprocessor Using its Instruction Set
1 This paper addresses the problem of testing path delay faults in a microprocessor using instructions. It is observed that a structurally testable path (i.e., a path testable thro...
Wei-Cheng Lai, Angela Krstic, Kwang-Ting Cheng
ISLPED
2006
ACM
129views Hardware» more  ISLPED 2006»
9 years 8 months ago
Variation-driven device sizing for minimum energy sub-threshold circuits
Sub-threshold operation is a compelling approach for energyconstrained applications, but increased sensitivity to variation must be mitigated. We explore variability metrics and t...
Joyce Kwong, Anantha P. Chandrakasan
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