3 search results - page 1 / 1 » Exploring linear structures of critical path delay faults to... |
ICCAD
2006
IEEE
14 years 1 months ago
2006
IEEE
It has been shown that the delay of a target path can be composed linearly of other path delays. If the later paths are robustly testable (with known delay values), the target pat...
VTS
2000
IEEE
13 years 9 months ago
2000
IEEE
1 This paper addresses the problem of testing path delay faults in a microprocessor using instructions. It is observed that a structurally testable path (i.e., a path testable thro...
ISLPED
2006
ACM
13 years 10 months ago
2006
ACM
Sub-threshold operation is a compelling approach for energyconstrained applications, but increased sensitivity to variation must be mitigated. We explore variability metrics and t...