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ICCAD
2006
IEEE
126views Hardware» more  ICCAD 2006»
10 years 14 days ago
Exploring linear structures of critical path delay faults to reduce test efforts
It has been shown that the delay of a target path can be composed linearly of other path delays. If the later paths are robustly testable (with known delay values), the target pat...
Shun-Yen Lu, Pei-Ying Hsieh, Jing-Jia Liou
VTS
2000
IEEE
94views Hardware» more  VTS 2000»
9 years 8 months ago
On Testing the Path Delay Faults of a Microprocessor Using its Instruction Set
1 This paper addresses the problem of testing path delay faults in a microprocessor using instructions. It is observed that a structurally testable path (i.e., a path testable thro...
Wei-Cheng Lai, Angela Krstic, Kwang-Ting Cheng
ISLPED
2006
ACM
129views Hardware» more  ISLPED 2006»
9 years 9 months ago
Variation-driven device sizing for minimum energy sub-threshold circuits
Sub-threshold operation is a compelling approach for energyconstrained applications, but increased sensitivity to variation must be mitigated. We explore variability metrics and t...
Joyce Kwong, Anantha P. Chandrakasan
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