55 search results - page 1 / 11 » Extraction Error Diagnosis and Correction in High-Performanc... |
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
Test model generation is crucial in the test generation process of a high-performance design targeted for large volume production. A key process in test model generation requires ...
VTS
1999
IEEE
13 years 9 months ago
1999
IEEE
This paper describes an approach to design error diagnosis and correction in combinational digital circuits. Our approach targets small errors introduced during the design process...
MICRO
2003
IEEE
13 years 10 months ago
2003
IEEE
Single-event upsets from particle strikes have become a key challenge in microprocessor design. Techniques to deal with these transient faults exist, but come at a cost. Designers...
VTS
1999
IEEE
13 years 9 months ago
1999
IEEE
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
An incremental simulation-based approach to fault diagnosis and logic debugging is presented. During each iteration of the algorithm, a single suspicious location is identified a...