24 search results - page 1 / 5 » FITE: future integrated testing environment |
SIGSOFT
2010
ACM
13 years 2 months ago
2010
ACM
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but al...
RE
1999
Springer
13 years 9 months ago
1999
Springer
Requirements Engineering (RE) investigates the impact of a future-oriented change vision, but the move towards this vision must consider a context heavily shaped by the past. As R...
TVLSI
2008
13 years 4 months ago
2008
With increasing levels of integration of multiple processing cores and new features to support software functionality, recent generations of microprocessors face difficult validati...
IAT
2009
IEEE
13 years 8 months ago
2009
IEEE
—We present a first effort to integrate NLP with ASP for autonomous agents, especially service robots, communicating with humans. We implemented a prototype system and tested it...