The path-delay fault simulation of functional tests on complex circuits such as current processor-based systems is a daunting task. The amount of computing power and memory needed...
Paolo Bernardi, Michelangelo Grosso, Matteo Sonza ...
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
Andrea Pellegrini, Kypros Constantinides, Dan Zhan...