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ITC
1999
IEEE
67views Hardware» more  ITC 1999»
13 years 9 months ago
Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment
SEMATECH has sponsored a "Test Method Evaluation" study to understand the trade-offs among the most common test methodologies used in the industry[1,2]. This paper prese...
Phil Nigh, David P. Vallett, Atul Patel, Jason Wri...
BMCBI
2010
150views more  BMCBI 2010»
13 years 2 months ago
Kernel based methods for accelerated failure time model with ultra-high dimensional data
Background: Most genomic data have ultra-high dimensions with more than 10,000 genes (probes). Regularization methods with L1 and Lp penalty have been extensively studied in survi...
Zhenqiu Liu, Dechang Chen, Ming Tan, Feng Jiang, R...
ITC
1996
IEEE
96views Hardware» more  ITC 1996»
13 years 9 months ago
Analysis and Detection of Timing Failures in an Experimental Test Chip
A 25k gate Test Chip was designed and manufactured to evaluate different test methods for scan-designed circuits. The design of the chip, the experiment, and preliminary experimen...
Piero Franco, Siyad C. Ma, Jonathan Chang, Yi-Chin...
ICST
2009
IEEE
13 years 12 months ago
On the Effectiveness of Test Extraction without Overhead
Developers write and execute ad-hoc tests as they implement software. While these tests reflect important insights of the developers (e.g., which parts of the software need testi...
Andreas Leitner, Alexander Pretschner, Stefan Mori...
TR
2010
159views Hardware» more  TR 2010»
12 years 12 months ago
Accelerated Degradation Tests Applied to Software Aging Experiments
Abstract--In the past ten years, the software aging phenomenon has been systematically researched, and recognized by both academic, and industry communities as an important obstacl...
Rivalino Matias, Pedro Alberto Barbetta, Kishor S....