24 search results - page 5 / 5 » Fast Statistical Timing Analysis By Probabilistic Event Prop... |
VLSID
2009
IEEE
14 years 6 months ago
2009
IEEE
: The challenges in nano-CMOS circuit design include the following: variability, leakage, power, thermals, reliability, and yield. This talk will focus on interdependent considerat...
HPCA
2009
IEEE
14 years 5 months ago
2009
IEEE
Decreasing hardware reliability is expected to impede the exploitation of increasing integration projected by Moore's Law. There is much ongoing research on efficient fault t...
ICDM
2009
IEEE
13 years 12 months ago
2009
IEEE
Abstract—We describe a novel application of using data mining and statistical learning methods to automatically monitor and detect abnormal execution traces from console logs in ...
IPSN
2007
Springer
13 years 11 months ago
2007
Springer
We study the problem of aggregating data from a sparse set of nodes in a wireless sensor network. This is a common situation when a sensor network is deployed to detect relatively...