At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
In software for embedded systems, the frequent use of interrupts for timing, sensing, and I/O processing can cause concurrency faults to occur due to interactions between applicat...
Abstract—We analyze the performance of fiber fault monitoring of a PON using a centralized, passive optical coding (OC) system. We develop an expression for the detected monitor...
The paper presents a test pattern generation and fault simulation methodology for the detection of catastrophic faults in analogue circuits. The test methodology chosen for evalua...
Stephen J. Spinks, Chris D. Chalk, Ian M. Bell, Ma...
The development of on line model-based fault detection systems in machinery improves the operational reliability of industrial systems and reduces the operational and maintenance ...