5 search results - page 1 / 1 » Fault Dictionary Size Reduction for Million-Gate Large Circu... |
ASPDAC
2007
ACM
13 years 8 months ago
2007
ACM
- In general, fault dictionary is prevented from practical applications for its extremely large size. Several previous works are proposed for the fault dictionary size reduction. H...
ICCD
2002
IEEE
13 years 9 months ago
2002
IEEE
The exceedingly large size of fault dictionaries constitutes a fundamental obstacle to their usage. We outline a new method to reduce significantly the size of fault dictionaries...
DAC
2006
ACM
14 years 5 months ago
2006
ACM
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we pre...
ITC
2002
IEEE
13 years 9 months ago
2002
IEEE
Efficient production testing is frequently hampered because current digital circuits require test sets which are too large. These test sets can be reduced significantly by means...
TCAD
2008
13 years 4 months ago
2008
Abstract--Simplifying a combinational circuit while preserving its range has a variety of applications, such as combinational equivalence checking and random simulation. Previous a...