22 search results - page 5 / 5 » Fault Grading FPGA Interconnect Test Configurations |
FPGA
2009
ACM
13 years 12 months ago
2009
ACM
Aggressive scaling increases the number of devices we can integrate per square millimeter but makes it increasingly difficult to guarantee that each device fabricated has the inte...
DAC
2005
ACM
14 years 6 months ago
2005
ACM
As Si CMOS devices are scaled down into the nanoscale regime, current computer architecture approaches are reaching their practical limits. Future nano-architectures will confront...