372 search results - page 2 / 75 » Fault Testing for Reversible Circuits |
ASPDAC
2006
ACM
13 years 11 months ago
2006
ACM
Abstract— Substantial attention is being paid to the fault diagnosis problem in recent test literature. Yet, the compaction of test vectors for fault diagnosis is little explored...
ICCD
2006
IEEE
14 years 2 months ago
2006
IEEE
— We have entered an era where chip yields are decreasing with scaling. A new concept called intelligible testing has been previously proposed with the goal of reversing this tre...
IAJIT
2010
13 years 3 months ago
2010
: In parity preserving reversible circuit, the parity of the input vector must match the parity of the output vector. It renders a wide class of circuit faults readily detectable a...
ET
2010
13 years 2 months ago
2010
This work justifies several quantum gate level fault models and discusses the causal error mechanisms thwarting correct function. A quantum adaptation of the classical test set gen...
VTS
1997
IEEE
13 years 9 months ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...