61 search results - page 2 / 13 » Fault tolerant nanoelectronic processor architectures |
CAMP
2005
IEEE
13 years 10 months ago
2005
IEEE
Abstract— The promise of next-generation computer technologies, such as nano-electronics, implies a number of serious alterations to the design flow of digital circuits. One of ...
DAC
2004
ACM
14 years 5 months ago
2004
ACM
Recent successes in the development and self-assembly of nanoelectronic devices suggest that the ability to manufacture dense nanofabrics is on the near horizon. However, the trem...
ASAP
2005
IEEE
13 years 10 months ago
2005
IEEE
In this paper we introduce a design methodology that allows the system/circuit designer to build reliable systems out of unreliable nano-scale components. The central point of our...
TPDS
2008
13 years 4 months ago
2008
It is widely accepted that transient failures will appear more frequently in chips designed in the near future due to several factors such as the increased integration scale. On th...
TC
2010
13 years 3 months ago
2010
—The number of CPUs in chip multiprocessors is growing at the Moore’s Law rate, due to continued technology advances. However, new technologies pose serious reliability challen...