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» Fault-Model-Based Test Generation for Embedded Software
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ITC
1996
IEEE
98views Hardware» more  ITC 1996»
13 years 9 months ago
Mixed-Mode BIST Using Embedded Processors
Abstract. In complex systems, embedded processors may be used to run software routines for test pattern generation and response evaluation. For system components which are not comp...
Sybille Hellebrand, Hans-Joachim Wunderlich, Andre...
GG
2004
Springer
13 years 10 months ago
Generating Test Cases for Code Generators by Unfolding Graph Transformation Systems
Abstract. Code generators are widely used in the development of embedded software to automatically generate executable code from graphical specifications. However, at present, cod...
Paolo Baldan, Barbara König, Ingo Stürme...
EMSOFT
2005
Springer
13 years 10 months ago
Random testing of interrupt-driven software
Interrupt-driven embedded software is hard to thoroughly test since it usually contains a very large number of executable paths. Developers can test more of these paths using rand...
John Regehr
IJIT
2004
13 years 6 months ago
A System for Performance Evaluation of Embedded Software
Developers need to evaluate software's performance to make software efficient. This paper suggests a performance evaluation system for embedded software. The suggested system ...
Yong-Yoon Cho, Jong-Bae Moon, Young-Chul Kim
ICST
2008
IEEE
13 years 11 months ago
Designing and Building a Software Test Organization
–Abstract for conference - preliminary Model-Based Testing: Models for Test Cases Jan Tretmans, Embedded Systems Institute, Eindhoven : Systematic testing of software plays an im...
Bruce Benton