2 search results - page 1 / 1 » Functional Illinois Scan Design at RTL |
ICCD
2004
IEEE
14 years 2 months ago
2004
IEEE
This paper shows that by creating functional scan chains at the register-transfer level (RTL), not only the timing of the circuit can be improved, but also the test data compressi...
VTS
2007
IEEE
13 years 11 months ago
2007
IEEE
In this paper, a novel test point insertion methodology is presented for RTL designs that aims to reduce the data volume of scan-based transition delay tests. Test points are iden...