202 search results - page 2 / 41 » Functional Test Generation Using Efficient Property Clusteri... |
DAC
2003
ACM
14 years 6 months ago
2003
ACM
Functional verification is widely acknowledged as the bottleneck in the hardware design cycle. This paper addresses one of the main challenges of simulation based verification (or...
VLSID
2010
IEEE
13 years 3 months ago
2010
IEEE
Directed test generation is important for the functional verification of complex system-on-chip designs. SAT based bounded model checking is promising for counterexample generatio...
BMCBI
2010
13 years 5 months ago
2010
Background: Genetic interaction profiles are highly informative and helpful for understanding the functional linkages between genes, and therefore have been extensively exploited ...
CCE
2004
13 years 5 months ago
2004
This work focuses on the basic stochastic decomposition (SD) algorithm of Higle and Sen [J.L. Higle, S. Sen, Stochastic Decomposition, Kluwer Academic Publishers, 1996] for two-st...
ITC
1997
IEEE
13 years 9 months ago
1997
IEEE
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests for them is becoming a serious problem in industry. This paper...