Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...
Traditional test generation methodologies for peripheral cores are performed by a skilled test engineer, leading to long generation times. In this paper a test generation methodolo...
Recently, a number of works have been published on implementing assignment decision diagram models combined with SAT methods to address register-transfer level test pattern genera...
This paper discusses how conventional testing criteria such as branch coverage can be applied for the testing of member functions inside a class. To support such testing technique...
In Sang Chung, Malcolm Munro, Wan Kwon Lee, Yong R...
In this paper, we propose a diagnostic algorithm for the case where distributed system specifications (implementations) are given in the form of communicating finite state machine...
Abderrazak Ghedamsi, Gregor von Bochmann, Rachida ...