123 search results - page 1 / 25 » Functional Test Generation for FSMs by Fault Extraction |
DAC
1994
ACM
13 years 10 months ago
1994
ACM
Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...
EVOW
2008
Springer
13 years 7 months ago
2008
Springer
Traditional test generation methodologies for peripheral cores are performed by a skilled test engineer, leading to long generation times. In this paper a test generation methodolo...
DSD
2006
IEEE
13 years 12 months ago
2006
IEEE
Recently, a number of works have been published on implementing assignment decision diagram models combined with SAT methods to address register-transfer level test pattern genera...
COMPSAC
1996
IEEE
13 years 10 months ago
1996
IEEE
This paper discusses how conventional testing criteria such as branch coverage can be applied for the testing of member functions inside a class. To support such testing technique...
ICDCS
1993
IEEE
13 years 10 months ago
1993
IEEE
In this paper, we propose a diagnostic algorithm for the case where distributed system specifications (implementations) are given in the form of communicating finite state machine...