174 search results - page 1 / 35 » Functional Test Generation for Full Scan Circuits |
DATE
2000
IEEE
13 years 9 months ago
2000
IEEE
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
We investigate a new fault ordering heuristic for test generation in full-scan circuits. The heuristic is referred to as the accidental detection index. It associates a value ADI ...
VTS
1995
IEEE
13 years 8 months ago
1995
IEEE
To ensure the production of reliable circuits and fully testable unpackaged dies for MCMs burn-in, both dynamic and monitored, remains a feasible option. During this burn-in proce...
DATE
1999
IEEE
13 years 9 months ago
1999
IEEE
A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...
DATE
1998
IEEE
13 years 9 months ago
1998
IEEE
Functional scan chains are scan chains that have scan paths through a circuit's functional logic and flip-flops. Establishing functional scan paths by test point insertion (T...