Cyclic stress tests for full scan circuits

To ensure the production of reliable circuits and fully testable unpackaged dies for MCMs burn-in, both dynamic and monitored, remains a feasible option. During this burn-in process the circuit needs to be stressed for an extended period of time. This requires computation of cyclic input sequences to stress the circuit. A taxanomy of stress related problems for full scan circuits is presented. It is shown that there are efficient ways to compute the sequences for most variations of monitored burn-in problems. The difficulty of computing stress tests for dynamic burn-in problems is discussed. Preliminary experimental results on ISCAS89 benchmark circuits are presented.

• Type: Conference
• Year: 1995
• Where: VTS
• Authors: Vinay Dabholkar, Sreejit Chakravarty, J. Najm, Janak H. Patel
• Keywords: Burn-in, Burn-in Problems, Hardware, Monitored Burn-in Problems, VTS 1995