We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
We investigate a new fault ordering heuristic for test generation in full-scan circuits. The heuristic is referred to as the accidental detection index. It associates a value ADI ...
To ensure the production of reliable circuits and fully testable unpackaged dies for MCMs burn-in, both dynamic and monitored, remains a feasible option. During this burn-in proce...
Vinay Dabholkar, Sreejit Chakravarty, J. Najm, Jan...
A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...
Functional scan chains are scan chains that have scan paths through a circuit's functional logic and flip-flops. Establishing functional scan paths by test point insertion (T...
Douglas Chang, Kwang-Ting Cheng, Malgorzata Marek-...